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Name : Atomic Force Microscope I (NT-MDT, Spectra) Use : |
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Name : Atomic Force Microscope II (Autoprobe CP-R) Use : |
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Name : Use : |
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Name : Probe Station (MSTech) Use : |
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Name : Semiconductor Parameter Analyzer (Keithley 4200) Use : |
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Name : Sourcemeter (2-Channel, Keithley 2636A) Use : |
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Name : Lock-in Amplifier (SR830) Use : |
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Name : Function Generator (SRS DS345) Use : |
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Name : Low-noise Voltage Preamplifier (SR560) Use : |
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Name : LCR Meter (Hioki 3532-50) Use : |
